Statistics
Publications
1
Citations
205
H-Index
1
Active since
2002
C.T. Liu is an author specializing in gate oxide reliability, engineering, and reliability degradation.
Publications per year
2002–2002
1
1
Ultra-thin gate dielectrics: they break down, but do they fail?
B. E. Weir, P. J. Silvėrman, D. Monroe et al. · 2002 · 205 citations
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