W.M. Loh

Modeling and measurement of contact resistances

W.M. Loh, S.E. Swirhun, T.A. Schreyer et al. · IEEE Transactions on Electron Devices · 1987 · 158 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity

W.M. Loh, Krishna C. Saraswat, R.W. Dutton · IEEE Electron Device Letters · 1985 · 67 citations

Natural Sciences, Electrical Engineering, Materials Science +16

An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors

W.M. Loh, S.E. Swirhun, E.F. Crabbé et al. · IEEE Electron Device Letters · 1985 · 38 citations

Natural Sciences, Electrical Engineering, Materials Science +15

2-D Simulations for accurate extraction of the specific contact resistivity from contact resistance data

W.M. Loh, S.E. Swirhun, T.A. Schreyer et al. · 1985 · 18 citations

Engineering, Electrical Engineering, Materials Science +17

Current crowding effects and determination of specific contact resistivity from contact end resistance (CER) measurements

S.E. Swirhun, W.M. Loh, R.M. Swanson et al. · IEEE Electron Device Letters · 1985 · 17 citations

Natural Sciences, Electrical Engineering, Materials Science +15