T. Yoshizawa

A 90-nm Low-Power 32-kB Embedded SRAM With Gate Leakage Suppression Circuit for Mobile Applications

Koji Nii, Yasumasa Tsukamoto, T. Yoshizawa et al. · IEEE Journal of Solid-State Circuits · 2004 · 83 citations

Engineering, Computer Engineering, Electrical Engineering +17

Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability

Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka et al. · 2005 · 42 citations

Engineering, Computer Engineering, Electrical Engineering +16

Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability

Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka et al. · ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. · 2005 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +16

A 90 nm low power 32 K-byte embedded SRAM with gate leakage suppression circuit for mobile applications

Koji Nii, Y. Tenoh, T. Yoshizawa et al. · 2004 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of actively body-bias controlled (ABC) SOI SRAM by using direct body contact technology for low-voltage application

Y. Hirano, T. Ippōshi, Hung Dang et al. · 2004 · 20 citations

Engineering, Computer Engineering, Electrical Engineering +17