Du-Eung Kim

A 90 nm 1.8 V 512 Mb Diode-Switch PRAM With 266 MB/s Read Throughput

Kwang‐Jin Lee, Beak-Hyung Cho, Wooyeong Cho et al. · IEEE Journal of Solid-State Circuits · 2008 · 191 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 0.1-$\mu{\hbox {m}}$ 1.8-V 256-Mb Phase-Change Random Access Memory (PRAM) With 66-MHz Synchronous Burst-Read Operation

Sangbeom Kang, Woo Yeong Cho, Beak-Hyung Cho et al. · IEEE Journal of Solid-State Circuits · 2007 · 136 citations

Engineering, Computer Engineering, Electrical Engineering +13

A 90nm 1.8V 512Mb Diode-Switch PRAM with 266MB/s Read Throughput

Kwang‐Jin Lee, Beak-Hyung Cho, Wooyeong Cho et al. · 2007 · 80 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 0.18 μm 3.0 V 64 Mb non-volatile phase-transition random-access memory (PRAM)

Woo Yeong Cho, Beak-Hyung Cho, Byung-Gil Choi et al. · 2004 · 57 citations

Engineering, Computer Engineering, Electrical Engineering +12

A 0.1/spl mu/m 1.8V 256Mb 66MHz Synchronous Burst PRAM

Sangbeom Kang, Wooyeong Cho, Beak-Hyung Cho et al. · 2006 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +9