G. Dalla Libera

Overcoming Temperature Limitations in Phase Change Memories With Optimized ${\rm Ge}_{\rm x}{\rm Sb}_{\rm y}{\rm Te}_{\rm z}$

P. Zuliani, E. Varesi, Elisabetta Palumbo et al. · IEEE Transactions on Electron Devices · 2013 · 126 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +23

Engineering of chalcogenide materials for embedded applications of Phase Change Memory

P. Zuliani, Elisabetta Palumbo, Massimo Borghi et al. · Solid-State Electronics · 2015 · 67 citations

Materials Engineering, Materials Science, Engineering +9

Physical characterization of hot-electron-induced MOSFET degradation through an improved approach to the charge-pumping technique

C. Bergonzoni, G. Dalla Libera · IEEE Transactions on Electron Devices · 1992 · 18 citations

Charge-pumping Technique, Engineering, Charge Transport +16

Detection and localization of gate oxide shorts in MOS transistors by optical-beam-induced current

Enrico Zanoni, G. Spiazzi, G. Dalla Libera et al. · IEEE Transactions on Electron Devices · 1991 · 18 citations

Engineering, Gate Oxide Shorts, Laser Applications +17

Current crowding and misalignment effects as sources of error in contact resistivity measurements—Part II: Experimental results and computer simulation of self-aligned test structures

P. Cappelletti, M. Finetti, A. Scorzoni et al. · IEEE Transactions on Electron Devices · 1987 · 13 citations