Thomas Zeschke

The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability

Simon G. Alcock, Kawal Sawhney, S M Scott et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2009 · 154 citations

Natural Sciences, Materials Science, Physics +11

Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler

Valeriy V. Yashchuk, Samuel K. Barber, Edward E. Domning et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2009 · 101 citations

Engineering, Hydrology, Metrology +7

On the characterization of ultra-precise X-ray optical components: advances and challenges in<i>ex situ</i>metrology

Frank Siewert, Jana Buchheim, Thomas Zeschke et al. · Journal of Synchrotron Radiation · 2014 · 75 citations · Full text

Natural Sciences, Materials Science, Physics +16

Characterization and calibration of 2nd generation slope measuring profiler

Frank Siewert, Jana Buchheim, Thomas Zeschke · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2009 · 71 citations

Engineering, Civil Engineering, Geological Engineering +12

Development of a high-performance gantry system for a new generation of optical slope measuring profilers

Lahsen Assoufid, Nathan Brown, D. J. Crews et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2012 · 49 citations

Engineering, Electrical Engineering, Instrumentation +6