Jana Buchheim

Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry

Frank Siewert, Jana Buchheim, Sébastien Boutet et al. · Optics Express · 2012 · 143 citations · Full text

X-ray Spectroscopy, Engineering, Microscopy +21

On the characterization of ultra-precise X-ray optical components: advances and challenges in<i>ex situ</i>metrology

Frank Siewert, Jana Buchheim, Thomas Zeschke et al. · Journal of Synchrotron Radiation · 2014 · 73 citations · Full text

Optical Materials, Engineering, Optical Testing +18

Characterization and calibration of 2nd generation slope measuring profiler

Frank Siewert, Jana Buchheim, Thomas Zeschke · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2009 · 71 citations

Sensor Calibration, Engineering, Measurement +7

Gratings for synchrotron and FEL beamlines: a project for the manufacture of ultra-precise gratings at Helmholtz Zentrum Berlin

Frank Siewert, Bernd Löchel, Jana Buchheim et al. · Journal of Synchrotron Radiation · 2017 · 44 citations · Full text

Sub-nm accuracy metrology for ultra-precise reflective X-ray optics

Frank Siewert, Jana Buchheim, Thomas Zeschke et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2010 · 42 citations · Full text

Engineering, Calibration, Optical Properties +6