Frank Siewert

The Variable Polarization XUV Beamline P04 at PETRA III: Optics, mechanics and their performance

Jens Viefhaus, Frank Scholz, Sascha Deinert et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2012 · 193 citations · Full text

Photonics, Engineering, Physics +6

The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY

Frank Siewert · AIP conference proceedings · 2004 · 154 citations

Optical Materials, Engineering, Microscopy +27

The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability

Simon G. Alcock, Kawal Sawhney, S M Scott et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2009 · 151 citations

Photonics, Organic Photonics, Optical Materials +13

Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry

Frank Siewert, Jana Buchheim, Sébastien Boutet et al. · Optics Express · 2012 · 143 citations · Full text

X-ray Spectroscopy, Engineering, Microscopy +21

Spatio-temporal coherence of free electron laser pulses in the soft x-ray regime

Rolf Mitzner, B. Siemer, M. Neeb et al. · Optics Express · 2008 · 123 citations · Full text