Andrew Ying

A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films

Andrew Ying, Conal E. Murray, I. C. Noyan · Journal of Applied Crystallography · 2009 · 44 citations

Natural Sciences, Materials Engineering, Materials Science +15

Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions

Conal E. Murray, Zhongqiao Ren, Andrew Ying et al. · Applied Physics Letters · 2009 · 37 citations

Engineering, Electrical Engineering, Materials Science +17

Nanoscale silicon-on-insulator deformation induced by stressed liner structures

Conal E. Murray, Andrew Ying, S. M. Polvino et al. · Journal of Applied Physics · 2011 · 26 citations

Natural Sciences, Materials Engineering, Materials Science +17

Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam

Andrew Ying, Braxton Osting, I. C. Noyan et al. · Journal of Applied Crystallography · 2010 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +17

A quantitative analysis of room temperature recrystallization kinetics in electroplated copper films using high resolution x-ray diffraction

Andrew Ying, Christian Witt, Jean Jordan‐Sweet et al. · Journal of Applied Physics · 2011 · 13 citations

Natural Sciences, Materials Engineering, Materials Science +17