Kazuya Konishi

Stacking fault expansion from basal plane dislocations converted into threading edge dislocations in 4H-SiC epilayers under high current stress

Kazuya Konishi, S. Yamamoto, Shuhei Nakata et al. · Journal of Applied Physics · 2013 · 66 citations · Full text

Fault Expansion, Engineering, Mechanical Engineering +16

Effect of Stacking Faults in Triangular Defects on 4H-SiC Junction Barrier Schottky Diodes

Kazuya Konishi, Shuhei Nakata, Yoshiyuki Nakaki et al. · Japanese Journal of Applied Physics · 2013 · 20 citations

Defect Tolerance, Electrical Engineering, Engineering +10

Next generation 650V CSTBT<sup>TM</sup> with improved SOA fabricated by an advanced thin wafer technology

Ryu Kamibaba, Kazuya Konishi, Yusuke Fukada et al. · 2015 · 20 citations

Semiconductors, Low-power Electronics, Electrical Engineering +13

Experimental demonstration of the active trench layout tuned 1200V CSTBT™ for lower dV/dt surge and turn-on switching loss

Kazuya Konishi, Ryu Kamibaba, Mariko Umeyama et al. · 2016 · 18 citations

Electrical Engineering, Gate Capacitance, Engineering +15

Direct observation and three dimensional structural analysis for threading mixed dislocation inducing current leakage in 4H–SiC IGBT

Kazuya Konishi, Yu Nakamura, Akemi Nagae et al. · Japanese Journal of Applied Physics · 2019 · 13 citations