B. Rheinländer

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

M. Schubert, John A. Woollam, Blaine Johs et al. · Journal of the Optical Society of America A · 1996 · 178 citations

Natural Sciences, Materials Engineering, Materials Science +15

Dielectric functions (1 to 5 eV) of wurtzite MgxZn1−xO (x⩽0.29) thin films

R. Schmidt, B. Rheinländer, M. Schubert et al. · Applied Physics Letters · 2003 · 171 citations

Natural Sciences, Materials Science, Physics +17

A Practical, Self‐Catalytic, Atomic Layer Deposition of Silicon Dioxide

Julien Bachmann, Robert Zierold, Yuen Tung Chong et al. · Angewandte Chemie International Edition · 2008 · 143 citations

Natural Sciences, Chemistry, Materials Science +12

Critical review of the current status of thickness measurements for ultrathin SiO ₂ on Si Part V: Results of a CCQM pilot study

M. P. Seah, Steven J. Spencer, Farid Bensebaa et al. · Surface and Interface Analysis · 2004 · 140 citations

Engineering, Materials Engineering, Materials Science +17

Lamellar Diblock Copolymer Thin Films Investigated by Tapping Mode Atomic Force Microscopy:  Molar-Mass Dependence of Surface Ordering

Peter Busch, Dorthe Posselt, Detlef‐M. Smilgies et al. · Macromolecules · 2003 · 72 citations

Natural Sciences, Chemistry, Materials Science +17