A. Nutsch

Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?

Paul Dietrich, C. Streeck, Stephan Glamsch et al. · Analytical Chemistry · 2015 · 73 citations · Full text

Engineering, Silane Layer, Chemistry +22

Approaches to calculate the dielectric function of ZnO around the band gap

Emil Agócs, Bálint Fodor, Beatrix Pollakowski et al. · Thin Solid Films · 2014 · 30 citations

Dielectric Function, Electrical Engineering, Engineering +6

Ultrafast Rabi Oscillations of Free-Carrier Transitions in InP

C. Fürst, Alfred Leitenstorfer, A. Nutsch et al. · physica status solidi (b) · 1997 · 29 citations · Full text

Semiconductors, Quantum Science, Excited State Property +14

Quantification of Variable Functional-Group Densities of Mixed-Silane Monolayers on Surfaces via a Dual-Mode Fluorescence and XPS Label

Tobias Fischer, Paul Dietrich, C. Streeck et al. · Analytical Chemistry · 2015 · 29 citations

Materials Science, Surface Characterization, Chemical Engineering +14

Expanded beam (macro-imaging) ellipsometry

M. Fried, Gergely Juhász, C. Major et al. · Thin Solid Films · 2010 · 26 citations

Beam Optic, Medical Imaging, Microscopy +5