C. Streeck

Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

Daniel Abou‐Ras, R. Caballero, Ch.‐H. Fischer et al. · Microscopy and Microanalysis · 2011 · 85 citations · Full text

X-ray Spectroscopy, Engineering, Se2 Thin Films +24

Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination?

Paul Dietrich, C. Streeck, Stephan Glamsch et al. · Analytical Chemistry · 2015 · 73 citations · Full text

Engineering, Silane Layer, Chemistry +22

Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory

Ioanna Mantouvalou, K. Witte, Wjatscheslav Martyanov et al. · Applied Physics Letters · 2016 · 36 citations

X-ray Spectroscopy, Engineering, Silicon Nitrate +17

Quantification of Variable Functional-Group Densities of Mixed-Silane Monolayers on Surfaces via a Dual-Mode Fluorescence and XPS Label

Tobias Fischer, Paul Dietrich, C. Streeck et al. · Analytical Chemistry · 2015 · 29 citations

Materials Science, Surface Characterization, Chemical Engineering +14

Ion beam analysis of Cu(In,Ga)Se 2 thin film solar cells

A. G. Karydas, C. Streeck, Iva Bogdanović Radović et al. · Applied Surface Science · 2015 · 18 citations

Materials Science, Ii-vi Semiconductor, Engineering +5