Statistics
Publications
4
Citations
63
H-Index
4
Active since
2002
Affiliations
Texas Instruments (United States)(Current)
B. Todd is an author at Texas Instruments (United States) specializing in microelectronics, engineering, and electrical engineering.
Publications per year
2002–2007
4
4
Gate Oxide Leakage and Floating Gate Capacitor Matching Test
Weidong Tian, Joe Trogolo, B. Todd et al. · 2007 · 10 citations
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