Statistics
Publications
3
Citations
110
H-Index
3
Active since
2001
W. Byers is an author at Science Applications International Corporation (United States) specializing in engineering, photodetectors, and cmos circuit design.
Publications per year
2001–2005
3
3
Proton damage effects in high performance P-channel CCDs
J.P. Spratt, C. Conger, R. Bredthauer et al. · IEEE Transactions on Nuclear Science · 2005 · 12 citations
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