IEEE Transactions on Nuclear Science · 2005 · 12 citations · 11 references
EngineeringElectrical EngineeringNuclear PhysicsRadiation DetectionDetector TechnologyPhotodetectorsRadiation Damage In MaterialsRadiation HardeningRadiation ResistanceRadiation-resistant MaterialsHardnessRadiation Damage EffectsRadiation Damage Effects On DetectorsRadiation Damage In DetectorsRadiation Damage In X-ray DetectorsRadiation-hard DevicesRadiation-hard Electronics
P-channel CCDs with pre-rad imaging characteristics comparable to the best N-channel CCDs have been fabricated and tested. These devices have been subjected to proton damage and display the superior hardness predicted for them.
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