G. E. Derkits - Concepedia

Author

G. E. Derkits

University of Pittsburgh

Also Known As

G E Derkits, G. Derkits, G. E. Derkits, G. E. JUN. DERKITS, G.E. Derkits, Gustav Derkits, Gustav E. Derkits

Publications

271

Citations

H-Index

Concepts

All Affiliations

University of Pittsburgh Nokia (United States)University of Limerick AT&T (United States)SC Johnson (United States)

About

G. E. Derkits is an author at University of Pittsburgh specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	11	199
2	Applied Physics	7	7	125
3	Chemical Engineering	5	5	102
4	Chemistry	4	4	74
5	Natural Sciences	2	2	25

G. E. Derkits

Publications

199

Citations

H-Index

Page 1

	Year	Citations
The Corrosion of Electronic Resistors Mark Reid, Jeff Punch, C.G. Ryan, IEEE Transactions on Components and Packaging Technologies Materials ScienceCorrosion TechnologyChemical EngineeringCorrosion ProtectionEngineering	2007	28
Dry Etching of GaAs , AlGaAs , and GaSb in Hydrochlorofluorocarbon Mixtures S. J. Pearton, W. S. Hobson, U. K. Chakrabarti, Journal of The Electrochemical Society Materials ScienceChemical EngineeringEngineeringElectronic MaterialsGlow Discharge	1990	27
Low-temperature field ionization of localized impurity levels in semiconductors Jayanth R. Banavar, D. D. Coon, G. E. Derkits Applied Physics Letters SemiconductorsElectrical EngineeringIon ImplantationEngineeringSemiconductor Device	1979	26
Quantum-mechanical estimates of the speed of field ionization of shallow impurity levels Siddheswar Chaudhuri, D. D. Coon, G. E. Derkits Applied Physics Letters Categoryquantum ElectronicsField Energy DensitiesEngineeringCharge ReleaseSemiconductor Device	1980	20
Corrosion of Cu under Highly Corrosive Environments Korhan Demirkan, G. E. Derkits, D. A. Fleming, Journal of The Electrochemical Society Materials ScienceMaterials EngineeringChemical EngineeringCorrosion ProtectionEngineering	2009	17
Microstructural Development of Copper Sulfide on Copper Exposed to Humid H[sub 2]S Mark Reid, Jeff Punch, C.G. Ryan, Journal of The Electrochemical Society EngineeringMetal ContaminationChemistryChemical DepositionCorrosion Inhibition	2007	16
Use of hydrogenated chlorofluorocarbon mixtures for reactive ion etching of In-based III–V semiconductors S. J. Pearton, W. S. Hobson, U. K. Chakrabarti, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena EngineeringChemistryReactive Ion EtchingPlasma ProcessingReactive Ion	1990	14
Rate of field ionization from<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>S</mml:mi></mml:math>states with a quantum defect S. Chaudhuri, D. D. Coon, G. E. Derkits, Physical review. A, General physics EngineeringNuclear PhysicsParabolic CoordinatesIon Beam InstrumentationIon Process	1981	14
Transistor action in novel GaAs/W/GaAs structures G. E. Derkits, J. P. Harbison, J. Levkoff, Applied Physics Letters SemiconductorsMaterials ScienceElectrical EngineeringSemiconductor TechnologyEngineering	1986	13
Biased Mixed Flowing Gas Testing for World Class Reliability G. E. Derkits, J. P. Franey, W. D. Reents, ECS Meeting Abstracts ReliabilityReliability EngineeringEngineeringAbstract AlgebraMeasurement	2006	13

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