Steven W. Novak

Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy

Jeffrey R. Shallenberger, David A. Cole, Steven W. Novak · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1999 · 148 citations

Materials Science, Oxide Heterostructures, Inorganic Chemistry +14

Use of Phosphine as an n-Type Dopant Source for Vapor−Liquid−Solid Growth of Silicon Nanowires

Yanfeng Wang, Kok‐Keong Lew, Tsung-Ta Ho et al. · Nano Letters · 2005 · 143 citations

Silicon Nanowires, Engineering, Chemistry +17

Structural and electrical properties of trimethylboron-doped silicon nanowires

Kok‐Keong Lew, Ling Pan, Timothy E. Bogart et al. · Applied Physics Letters · 2004 · 128 citations

Engineering, Chemistry, Silicon On Insulator +16

Beryllium Diffusion of Ruby and Sapphire

John L. Emmett, Kenneth Scarratt, Shane F. McClure et al. · Gems & Gemology · 2003 · 98 citations · Full text

Beryllium Diffusion, Diffusion Process, Anomalous Diffusion +1

SiO 2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry

David A. Cole, Jeffrey R. Shallenberger, Steven W. Novak et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 96 citations

Engineering, Microscopy, Ion Implants +19