Jeffrey R. Shallenberger

Active pixel sensor matrix based on monolayer MoS2 phototransistor array

Akhil Dodda, Darsith Jayachandran, Andrew Pannone et al. · Nature Materials · 2022 · 206 citations

Engineering, Electrical Engineering, Materials Engineering +14

Atomically thin half-van der Waals metals enabled by confinement heteroepitaxy

Natalie Briggs, Brian Bersch, Yuanxi Wang et al. · Nature Materials · 2020 · 195 citations · Full text

Natural Sciences, Materials Science, Physics +14

Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy

Jeffrey R. Shallenberger, David A. Cole, Steven W. Novak · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1999 · 150 citations

Natural Sciences, Materials Engineering, Materials Science +15

SiO 2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry

David A. Cole, Jeffrey R. Shallenberger, Steven W. Novak et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 96 citations

Natural Sciences, Materials Engineering, Materials Science +17

Determination of chemistry and microstructure in SiO<i>x</i> (0.1&amp;lt;<i>x</i>&amp;lt;0.8) films by x-ray photoelectron spectroscopy

Jeffrey R. Shallenberger · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1996 · 73 citations

Natural Sciences, Chemistry, Materials Science +17