R. Kakoschke

Scaling properties of the tunneling field effect transistor (TFET): Device and circuit

T. Nirschl, St. Henzler, J. Fischer et al. · Solid-State Electronics · 2005 · 101 citations

Device Modeling, Electrical Engineering, Engineering +6

High-resolution auger spectra of adsorbates

J. C. Fuggle, E. Umbach, R. Kakoschke et al. · Journal of Electron Spectroscopy and Related Phenomena · 1982 · 75 citations

Engineering, Photochemistry, Natural Sciences +9

The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes

T. Nirschl, Pengzhan Wang, C. E. Webe et al. · 2005 · 70 citations

Electrical Engineering, Engineering, Vlsi Design +11

Modelling of wafer heating during rapid thermal processing

R. Kakoschke, E. Bu�mann, H. F�ll · Applied Physics A · 1990 · 41 citations

Heat Transfer Process, Engineering, Industrial Engineering +6

Modulated optical reflectance measurements on amorphous silicon layers and detection of residual defects

Stefan Wurm, P. Alpern, D. Savignac et al. · Applied Physics A · 1988 · 35 citations

Photonics, Amorphous Silicon Layers, Optical Materials +12