G. Boudreault

Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool

C. Jeynes, N.P. Barradas, Paul Marriott et al. · Journal of Physics D Applied Physics · 2003 · 183 citations

Natural Sciences, Chemistry, Materials Science +9

Ion beam synthesis of superconducting MgB2 thin films

Nianhua Peng, Guosheng Shao, C. Jeynes et al. · Applied Physics Letters · 2003 · 37 citations · Full text

Natural Sciences, Materials Science, Physics +16

Accurate RBS measurement of ion implant doses in silicon

G. Boudreault, C. Jeynes, E. Wendler et al. · Surface and Interface Analysis · 2002 · 32 citations

Engineering, Materials Engineering, Materials Science +17

Round Robin: measurement of H implantation distributions in Si by elastic recoil detection

G. Boudreault, R. G. Elliman, R. Grötzschel et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2004 · 27 citations

Engineering, Electrical Engineering, Instrumentation +10

Preparation and characterization of metallorganic chemical vapour deposited molybdenum (II) oxide (MoO) thin films

Olusoji O. Ilori, O. Osasona, Marcus Adebola Eleruja et al. · Thin Solid Films · 2004 · 15 citations

Natural Sciences, Materials Engineering, Materials Science +12