Statistics
Publications
6
Citations
243
H-Index
6
Active since
2004
Affiliations
J. Eliason is an author at Texas Instruments (United States) specializing in semiconductor devices, electrical engineering, and engineering.
Publications per year
2004–2010
6
6
Reliability of Ferroelectric Random Access memory embedded within 130nm CMOS
J. Rodriguez, K. Remack, J. Gertas et al. · 2010 · 59 citations
Engineering, Computer Engineering, Electrical Engineering +15
Krishna Udayakumar, T. S. Moise, Scott R. Summerfelt et al. · Japanese Journal of Applied Physics · 2007 · 12 citations
Engineering, Computer Engineering, Electrical Engineering +17
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