M. D. Manyakin

Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

M. D. Manyakin, O. I. Dubrovskiĭ, É. P. Domashevskaya et al. · Materials Science in Semiconductor Processing · 2019 · 25 citations

Materials Science, Surface Characterization, X-ray Spectroscopy +8

Theoretical and experimental study of the electronic structure of tin dioxide

M. D. Manyakin, O. I. Dubrovskiĭ, S. Yu. Turishchev et al. · Physics of the Solid State · 2014 · 21 citations

A novel approach to the electronic structure and surface composition investigations of tin-oxygen system materials by means of X-ray absorption spectroscopy combined with ab initio calculations

M. D. Manyakin, O. I. Dubrovskiĭ, É. P. Domashevskaya et al. · Computational Materials Science · 2016 · 21 citations

Materials Science, Materials Engineering, Inorganic Chemistry +10

Spectromicroscopy Studies of Silicon Nanowires Array Covered by Tin Oxide Layers

S. Yu. Turishchev, Alexander Schleusener, E. V. Parinova et al. · Small · 2023 · 10 citations · Full text