E. V. Parinova

XPS investigations of MOCVD tin oxide thin layers on Si nanowires array

S. Yu. Turishchev, E. V. Parinova, D. A. Koyuda et al. · Results in Physics · 2018 · 36 citations · Full text

Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

M. D. Manyakin, O. I. Dubrovskiĭ, É. P. Domashevskaya et al. · Materials Science in Semiconductor Processing · 2019 · 25 citations

Materials Science, Surface Characterization, X-ray Spectroscopy +8

Surface deep profile synchrotron studies of mechanically modified top-down silicon nanowires array using ultrasoft X-ray absorption near edge structure spectroscopy

S. Yu. Turishchev, E. V. Parinova, Alexandra K. Pisliaruk et al. · Scientific Reports · 2019 · 20 citations · Full text

Surface modification and oxidation of Si wafers after low energy plasma treatment in hydrogen, helium and argon

S. Yu. Turishchev, V. A. Terekhov, E. V. Parinova et al. · Materials Science in Semiconductor Processing · 2013 · 16 citations

Chemical Engineering, Engineering, Si Wafers +10

Spectromicroscopy Studies of Silicon Nanowires Array Covered by Tin Oxide Layers

S. Yu. Turishchev, Alexander Schleusener, E. V. Parinova et al. · Small · 2023 · 10 citations · Full text