Concepedia

Publication | Closed Access

Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

DOI

25

Citations

32

References

2019

Year

M. D. Manyakin, O. I. Dubrovskiĭ, É. P. Domashevskaya, S. V. Ryabtsev, Ruslan Ovsyannikov, E. V. Parinova, S. Yu. Turishchev
Materials Science in Semiconductor Processing

References

YearCitations

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