S. Yu. Turishchev

XANES and XPS investigations of surface defects in wire-like SnO2 crystals

É. P. Domashevskaya, S. V. Ryabtsev, Yu. A. Yurakov et al. · Physics of the Solid State · 2015 · 51 citations

XPS investigations of MOCVD tin oxide thin layers on Si nanowires array

S. Yu. Turishchev, E. V. Parinova, D. A. Koyuda et al. · Results in Physics · 2018 · 36 citations · Full text

Evolution of nanoporous silicon phase composition and electron energy structure under natural ageing

S. Yu. Turishchev, A. S. Lenshin, É. P. Domashevskaya et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2009 · 28 citations

Photoluminescence Evolution, Engineering, Nanoporous Material +18

XPS and XANES studies of SnO x nanolayers

É. P. Domashevskaya, S. V. Ryabtsev, S. Yu. Turishchev et al. · Journal of Structural Chemistry · 2008 · 28 citations

Materials Science, Nanoscale System, X-ray Spectroscopy +7

Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

M. D. Manyakin, O. I. Dubrovskiĭ, É. P. Domashevskaya et al. · Materials Science in Semiconductor Processing · 2019 · 25 citations

Materials Science, Surface Characterization, X-ray Spectroscopy +8