Muhammad Zeshan Ali

Future on-chip interconnect metallization and electromigration

Chunhua Hu, James J. Kelly, Huai Huang et al. · 2018 · 69 citations

Materials Science, Materials Engineering, Electrical Engineering +15

Electromigration and resistivity in on-chip Cu, Co and Ru damascene nanowires

Chunhua Hu, James J. Kelly, J. H-C Chen et al. · 2017 · 43 citations

Engineering, Interconnect (Integrated Circuits), Nanoelectronics +18

Multifunctional structural lithium ion batteries for electrical energy storage applications

Atif Javaid, Muhammad Zeshan Ali · Materials Research Express · 2018 · 32 citations

Engineering, Structural Battery, Mechanical Engineering +19

Simultaneous enhancement of conductivity and Seebeck coefficient of PEDOT:PSS by triflic acid treatment for flexible thermoelectric generator

Muhammad Zeshan Ali, Ku Marsilla Ku Ishak, Mohamad Adzhar Md Zawawi et al. · Synthetic Metals · 2022 · 31 citations

Materials Science, Conducting Polymer, Electrical Engineering +11

Mechanisms of Electromigration Damage in Cu Interconnects

Chunhua Hu, L. Gignac, G. Lian et al. · 2018 · 26 citations

Materials Engineering, Materials Science, Electrical Engineering +13