Tze Wee Chen

Nonvolatile SRAM Cell

Wei Wang, Aaron Gibby, Zheng Wang et al. · 2006 · 66 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +11

Gate-Oxide Early Life Failure Prediction

Tze Wee Chen, Kyunglok Kim, Young Moon Kim et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2008 · 39 citations

Reliability, Candidate Transistor, Electrical Engineering +13

Experimental study of gate oxide early-life failures

Tze Wee Chen, Young Moon Kim, Kyunglok Kim et al. · IEEE International Reliability Physics Symposium proceedings · 2009 · 21 citations

Hardware Security, Candidate Transistor, Electrical Engineering +12

ESD design challenges and strategies in deeply-scaled integrated circuits

Shuqing Cao, Tze Wee Chen, Stephen G. Beebe et al. · 2009 · 19 citations

Engineering, Vlsi Design, Electronic Design +17

Gate-oxide early-life failure identification using delay shifts

Young Moon Kim, Tze Wee Chen, Yoshio Kameda et al. · 2010 · 13 citations

Engineering, Mem Testing, Computer Architecture +16