Statistics
Publications
4
Citations
85
H-Index
4
Active since
2006
Affiliations
NEC (Japan)(Current)
Yoshio Kameda is an author at NEC (Japan) specializing in microelectronics, computer engineering, and engineering.
Publications per year
2006–2010
4
4
Low-cost gate-oxide early-life failure detection in robust systems
Young Moon Kim, Yoshio Kameda, Hyunki Kim et al. · 2010 · 38 citations
Gate-oxide early-life failure identification using delay shifts
Young Moon Kim, Tze Wee Chen, Yoshio Kameda et al. · 2010 · 13 citations
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