J.F. Buller

Effects of beam incident angle control on NMOS source/drain extension applications

Ukyo Jeong, S. Mehta, C. Campbell et al. · 2002 · 16 citations

Engineering, Electrical Engineering, Circuit Theory +15

Electrical and radiation characterization of three SOI material technologies

W. Krull, J.F. Buller, G.V. Rouse et al. · IEEE Circuits and Devices Magazine · 1987 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

Integrating Structural Context into the Assessment of Political Leadership: Philosophical Realism, Gordon Brown and the Great Financial Crisis

J.F. Buller, Toby S. James · Parliamentary Affairs · 2014 · 12 citations · Full text

Humanities, Philosophy, Political Science +9

Manufacturing issues related to RTP induced overlay errors in a global alignment stepper technology

J.F. Buller, M. M. Farahani, S. Garg · IEEE Transactions on Semiconductor Manufacturing · 1996 · 12 citations

Engineering, Computer Engineering, Manufacturing Engineering +17