Daniel K. Simon

On the Control of the Fixed Charge Densities in Al₂O₃-Based Silicon Surface Passivation Schemes

Daniel K. Simon, Paul M. Jordan, Thomas Mikolajick et al. · ACS Applied Materials & Interfaces · 2015 · 129 citations

Symmetrical Al2O3-based passivation layers for p- and n-type silicon

Daniel K. Simon, Paul M. Jordan, I. Dirnstorfer et al. · Solar Energy Materials and Solar Cells · 2014 · 47 citations

Engineering, Applied Physics, N-type Silicon +3

On the local conductivity of individual diamond seeds and their impact on the interfacial resistance of boron-doped diamond films

Menelaos Tsigkourakos, Thomas Hantschel, Daniel K. Simon et al. · Carbon · 2014 · 27 citations

Materials Engineering, Materials Science, Diamond-like Carbon +12

Trapped charge densities in Al2O3-based silicon surface passivation layers

Paul M. Jordan, Daniel K. Simon, Thomas Mikolajick et al. · Journal of Applied Physics · 2016 · 24 citations

Oxide Heterostructures, Al2o3 Layers, Electrical Engineering +12

Atomic layer deposited high-<i>κ</i> nanolaminates for silicon surface passivation

Frank Benner, Paul M. Jordan, Claudia Richter et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2014 · 23 citations

Materials Science, Conventional Al2o3 Films, Engineering +11