Takashi Ishigaki

Local $V_{\rm th}$ Variability and Scalability in Silicon-on-Thin-BOX (SOTB) CMOS With Small Random-Dopant Fluctuation

Nobuyuki Sugii, Ryuta Tsuchiya, Takashi Ishigaki et al. · IEEE Transactions on Electron Devices · 2010 · 109 citations

Engineering, Computer Engineering, Electrical Engineering +17

A multi-level-cell spin-transfer torque memory with series-stacked magnetotunnel junctions

Takashi Ishigaki, T. Kawahara, R. Takemura et al. · 2010 · 106 citations

Natural Sciences, Materials Engineering, Materials Science +12

Smallest V<inf>th</inf> variability achieved by intrinsic silicon on thin BOX (SOTB) CMOS with single metal gate

Yukinori Morita, Ryuta Tsuchiya, Takashi Ishigaki et al. · 2008 · 73 citations

Engineering, Computer Engineering, Electrical Engineering +15

Comprehensive study on vth variability in silicon on Thin BOX (SOTB) CMOS with small random-dopant fluctuation: Finding a way to further reduce variation

Nobuyuki Sugii, Ryuta Tsuchiya, Takashi Ishigaki et al. · 2008 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +15

Analysis of Degradation Phenomena in Bipolar Degradation Screening Process for SiC-MOSFETs

Takashi Ishigaki, Tatsunori Murata, Koyo Kinoshita et al. · 2019 · 49 citations

Engineering, Electrical Engineering, Materials Science +17