J. P. Carrejo

Thermal imaging using the atomic force microscope

Arun Majumdar, J. P. Carrejo, Jie-Wei Lai · Applied Physics Letters · 1993 · 244 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Nanometer-scale lithography using the atomic force microscope

Arun Majumdar, P. I. Oden, J. P. Carrejo et al. · Applied Physics Letters · 1992 · 191 citations

Natural Sciences, Materials Engineering, Materials Science +13

Thermal detection of device failure by atomic force microscopy

Jie-Wei Lai, M. Chandrachood, A. Majumda et al. · IEEE Electron Device Letters · 1995 · 43 citations

Engineering, Electrical Engineering, Physics +17

Effect of Temperature on the Interaction of Silicon with Nonionic Surfactants in Alkaline Solutions

Joong S. Jeon, Srini Raghavan, J. P. Carrejo · Journal of The Electrochemical Society · 1996 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +17

Detection of subsurface voids using scanning thermal microscopy

Gordon B. Mills, Jonathan Weaver, Gari Harris et al. · Ultramicroscopy · 1999 · 21 citations

Natural Sciences, Materials Engineering, Materials Science +12