Jeff Hale

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Active since

1985

Affiliations

J.A. Woollam Company (United States)(Current)

University of Nebraska–Lincoln

Jeff Hale is an author at J.A. Woollam Company (United States) specializing in thin film optical properties, spectroscopic ellipsometry, and natural sciences.

Publications per year

1985–2002

Publications

<title>Recent developments in spectroscopic ellipsometry for in-situ applications</title>

Blaine Johs, Jeff Hale, N. J. Ianno et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 42 citations

Natural Sciences, Materials Engineering, Materials Science +17

Effects of nickel and copper mixtures on tomato in sand culture

Jeff Hale, D. P. Ormrod, P.J. Laffey et al. · Environmental Pollution Series A Ecological and Biological · 1985 · 21 citations

Agriculture, Agronomy, Crop Sciences +11

Studies of metallic multilayer structures, optical properties, and oxidation using <i>in situ</i> spectroscopic ellipsometry

Xiang Gao, Jeff Hale, Scott Heckens et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1998 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +17

Optical Monitoring of Thin-films Using Spectroscopic Ellipsometry

Dale E. Morton, Blaine Johs, Jeff Hale · 2002 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +16

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