Doris Schmitt-Landsiedel

A Local Passive Time Interpolation Concept for Variation-Tolerant High-Resolution Time-to-Digital Conversion

Stephan Henzler, S. Koeppe, Dominik Lorenz et al. · IEEE Journal of Solid-State Circuits · 2008 · 141 citations

Engineering, Clock Recovery, Calibration +12

90nm 4.7ps-Resolution 0.7-LSB Single-Shot Precision and 19pJ-per-Shot Local Passive Interpolation Time-to-Digital Converter with On-Chip Characterization

Stephan Henzler, S. Koeppe, Winfried Kamp et al. · 2008 · 119 citations

Electrical Engineering, Engineering, Jitter Measurement +12

DRAM Yield Analysis and Optimization by a Statistical Design Approach

Yan Li, Helmut Schneider, Florian Schnabel et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 2011 · 53 citations

Electric Yield, Electrical Engineering, Engineering +12

</title> </titles> <publication_date> <month>11</month> <year>2008</year> </publication_date> <pages> <first_page>676</first_page> <last_page>676</last_page> </pages> <publisher_item> <item_number item_number_type='sequence-number'>4666783</item_number> </publisher_item> <doi_data> <doi>10.1109/TSM.2008.2008790</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=4666783</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[Analysis of Read Current and Write Trip Voltage Variability From a 1-MB SRAM Test Structure

T Fischer, E. Amirante, Peter Huber et al. · IEEE Transactions on Semiconductor Manufacturing · 2008 · 41 citations

A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors

Thomas Fischer, E. Amirante, Karl Hofmann et al. · 2008 · 27 citations

Device Modeling, Electrical Engineering, Semiconductor Device +15