E. Amirante

Investigation of Increased Multi-Bit Failure Rate Due to Neutron Induced SEU in Advanced Embedded SRAMs

Georg Georgakos, Peter Huber, Martin Ostermayr et al. · 2007 · 42 citations

Engineering, Vlsi Design, Computer Architecture +16

</title> </titles> <publication_date> <month>11</month> <year>2008</year> </publication_date> <pages> <first_page>676</first_page> <last_page>676</last_page> </pages> <publisher_item> <item_number item_number_type='sequence-number'>4666783</item_number> </publisher_item> <doi_data> <doi>10.1109/TSM.2008.2008790</doi> <resource>http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=4666783</resource> </doi_data> </journal_article> <journal_article> <titles> <title><![CDATA[Analysis of Read Current and Write Trip Voltage Variability From a 1-MB SRAM Test Structure

T Fischer, E. Amirante, Peter Huber et al. · IEEE Transactions on Semiconductor Manufacturing · 2008 · 41 citations

Variations of the Power Dissipation in Adiabatic Logic Gates

E. Amirante, A. Bargagli-Stoffi, Jürgen Fischer et al. · Minerva Pediatrica · 2011 · 31 citations

A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors

Thomas Fischer, E. Amirante, Karl Hofmann et al. · 2008 · 27 citations

Device Modeling, Electrical Engineering, Semiconductor Device +15

Improving the positive feedback adiabatic logic familiy

J. Fischer, E. Amirante, A. Bargagli-Stoffi et al. · Advances in radio science · 2005 · 25 citations · Full text

Device Modeling, Quantum Science, Electrical Engineering +14