Statistics
Publications
1
Citations
126
H-Index
1
Active since
1996
Affiliations
Sandia National Laboratories(Current)
A.J. Farino is an author at Sandia National Laboratories specializing in gate oxide scaling, device reliability, and radiation hardening.
Publications per year
1996–1996
1
1
Impact of technology trends on SEU in CMOS SRAMs
P.E. Dodd, F.W. Sexton, G.L. Hash et al. · IEEE Transactions on Nuclear Science · 1996 · 126 citations
Engineering, Computer Engineering, Electrical Engineering +17
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