Haihua Yan

Experiments in detecting delay faults using multiple higher frequency clocks and results from neighboring die

Haihua Yan, A.D. Singh · 2004 · 62 citations

Engineering, Computer Engineering, Electrical Engineering +14

Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction

Anshuman Chandra, Haihua Yan, Rohit Kapur · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +16

Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study

Haihua Yan, A.D. Singh · 2005 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +14

A delay test to differentiate resistive interconnect faults from weak transistor defects

Haihua Yan, A.D. Singh · 2005 · 22 citations

Engineering, Computer Engineering, Electrical Engineering +17

A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI)

Haihua Yan, Adit D. Singh · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2006 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +17