Statistics
Publications
2
Citations
52
H-Index
2
Active since
2009
Affiliations
J. Batzel is an author at Intel (United States) specializing in epitaxial growth, x-ray diffraction analysis, and semiconductor surfaces.
Publications per year
2009–2010
2
2
Commercial molecular beam epitaxy production of high quality SrTiO3 on large diameter Si substrates
Xing Gu, D. Lubyshev, J. Batzel et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 38 citations
Natural Sciences, Materials Engineering, Materials Science +17
1–2 of 2