Hyohyun Nam

Study of High-k/Metal-Gate Work-Function Variation Using Rayleigh Distribution

Hyohyun Nam, Changhwan Shin · IEEE Electron Device Letters · 2013 · 43 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +13

Study of Work-Function Variation in High-<inline-formula> <tex-math notation="LaTeX">$\kappa $ </tex-math> </inline-formula>/Metal-Gate Gate-All-Around Nanowire MOSFET

Hyohyun Nam, Young-Taek Lee, Jung‐Dong Park et al. · IEEE Transactions on Electron Devices · 2016 · 41 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +13

Symmetric tunnel field-effect transistor (S-TFET)

Hyohyun Nam, Min Hee Cho, Changhwan Shin · Current Applied Physics · 2014 · 38 citations

Electrical Engineering, Engineering, Tunneling Microscopy +3

Impact of Current Flow Shape in Tapered (Versus Rectangular) FinFET on Threshold Voltage Variation Induced by Work-Function Variation

Hyohyun Nam, Changhwan Shin · IEEE Transactions on Electron Devices · 2014 · 35 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +9

Random Variation Analysis and Variation-Aware Design of Symmetric Tunnel Field-Effect Transistor

Hyunjae Lee, Seulki Park, Young-Taek Lee et al. · IEEE Transactions on Electron Devices · 2014 · 34 citations

Device Modeling, Electrical Engineering, Variation-aware Design +12