Tihomir Knežević

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

A. Šakić, Lis K. Nanver, Gerard van Veen et al. · 2010 · 38 citations

Engineering, Electrical Engineering, Materials Science +17

Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

Tihomir Knežević, Xingyu Liu, Erwin Hardeveld et al. · IEEE Electron Device Letters · 2019 · 25 citations · Full text

Engineering, Materials Engineering, Materials Science +16

Boron-layer silicon photodiodes for high-efficiency low-energy electron detection

A. Šakić, Lis K. Nanver, T.L.M. Scholtes et al. · Solid-State Electronics · 2011 · 19 citations

Engineering, Electrical Engineering, Materials Engineering +14

Nanometer-thin pure boron CVD layers as material barrier to Au or Cu metallization of Si

Shivakumar D. Thammaiah, Tihomir Knežević, Lis K. Nanver · Journal of Materials Science Materials in Electronics · 2021 · 15 citations · Full text

Engineering, Materials Engineering, Materials Science +17

M-center in low-energy electron irradiated 4<i>H</i>-SiC

Tihomir Knežević, A. Hadžipašić, Takeshi Ohshima et al. · Applied Physics Letters · 2022 · 12 citations · Full text

Natural Sciences, Materials Science, Physics +17