G.J. Riedel

Time-Resolved Temperature Measurement of AlGaN/GaN Electronic Devices Using Micro-Raman Spectroscopy

Martin Kuball, G.J. Riedel, James W. Pomeroy et al. · IEEE Electron Device Letters · 2007 · 138 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +15

Reducing Thermal Resistance of AlGaN/GaN Electronic Devices Using Novel Nucleation Layers

G.J. Riedel, James W. Pomeroy, K.P. Hilton et al. · IEEE Electron Device Letters · 2009 · 77 citations

Materials Science, Materials Engineering, Electrical Engineering +15

On reliability of medium voltage multilevel converters

R. Grinberg, G.J. Riedel, A. Korn et al. · 2013 · 57 citations

Reliability, Cascaded Cells, Electrical Engineering +10

Nanosecond Timescale Thermal Dynamics of AlGaN/GaN Electronic Devices

G.J. Riedel, James W. Pomeroy, K.P. Hilton et al. · IEEE Electron Device Letters · 2008 · 51 citations

Wide-bandgap Semiconductor, Electrical Engineering, Electronic Devices +15

A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off

Vinoth Sundaramoorthy, Enea Bianda, Richard Bloch et al. · Microelectronics Reliability · 2014 · 25 citations

Device Modeling, Igbt Junction Temperature, Electrical Engineering +7