J. Dreibelbis

A 300MHz multi-banked, eDRAM macro featuring GND sense, bit-line twisting and direct reference cell write

J. Barth, D. Anand, J. Dreibelbis et al. · 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) · 2005 · 24 citations

Engineering, Vlsi Design, Computer Architecture +17

Embedded DRAM built in self test and methodology for test insertion

P. Jakobsen, J. Dreibelbis, Gary Pomichter et al. · 2002 · 22 citations

Test Insertion, Engineering, Mem Testing +18

A 256K SRAM with on-chip power supply conversion

A. Roberts, J. Dreibelbis, G. Braceras et al. · 1987 · 12 citations

Low-power Electronics, Electrical Engineering, Pin Voltage +11

Test and repair of large embedded DRAMs. 2

Erik Nelson, J. Dreibelbis, R. McConnell · 2002 · 12 citations

Hardware Security, Electrical Engineering, Memory Architecture +13