S. Deora

A critical re-evaluation of the usefulness of R-D framework in predicting NBTI stress and recovery

Souvik Mahapatra, Ahmad E. Islam, S. Deora et al. · 2011 · 104 citations

Engineering, Mechanical Engineering, Nbti Stress +17

Methodology for the statistical evaluation of the effect of random telegraph noise (RTN) on RRAM characteristics

Dmitry Veksler, G. Bersuker, Bhaswar Chakrabarti et al. · 2012 · 55 citations

Electrical Engineering, Engineering, Rram Characteristics +10

Positive Bias Instability and Recovery in InGaAs Channel nMOSFETs

S. Deora, G. Bersuker, W.Y. Loh et al. · IEEE Transactions on Device and Materials Reliability · 2013 · 43 citations

Defect Tolerance, Electrical Engineering, Engineering +12

On the differences between ultra-fast NBTI measurements and Reaction-Diffusion theory

Ahmad E. Islam, Souvik Mahapatra, S. Deora et al. · 2009 · 25 citations

Relaxation Process, Chemical Kinetics, Engineering +17

Real-time study of switching kinetics in integrated 1T/ HfO<inf>x</inf> 1R RRAM: Intrinsic tunability of set/reset voltage and trade-off with switching time

S. Koveshnikov, K. Matthews, Kyung‐Tai Min et al. · 2012 · 23 citations

Engineering, Emerging Memory Technology, Integrated Circuits +17