H. Hirshy

The nature of nitrogen related point defects in common forms of InN

K.S.A. Butcher, Alanna Fernandes, P. P.‐T. Chen et al. · Journal of Applied Physics · 2007 · 61 citations

Natural Sciences, Materials Science, Physics +17

Stoichiometry effects and the Moss–Burstein effect for InN

Kenneth Butcher, H. Hirshy, R. M. Perks et al. · physica status solidi (a) · 2006 · 40 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Buffer-Induced Current Collapse in GaN HEMTs on Highly Resistive Si Substrates

Hareesh Chandrasekar, Michael J. Uren, Abdalla Eblabla et al. · IEEE Electron Device Letters · 2018 · 38 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Self-aligned flexible organic thin-film transistors with gates patterned by nano-imprint lithography

Herbert Gold, Anja Haase, Alexander Fian et al. · Organic Electronics · 2015 · 34 citations

Engineering, Electrical Engineering, Materials Science +14

Process Factors Influence on Cavity Pressure Behavior in Microinjection Moulding

C. A. Griffiths, Stefan Dimov, Steffen Scholz et al. · Journal of Manufacturing Science and Engineering · 2011 · 31 citations · Full text

Engineering, Manufacturing Engineering, Materials Science +16