M. Inohara

High performance 65 nm SOI technology with dual stress liner and low capacitance SRAM cell

E. Leobandung, H. Nayakama, D. Mocuta et al. · 2005 · 65 citations

Electrical Engineering, Engineering, Vlsi Design +15

Investigation of CVD SiCOH low-k time-dependent dielectric breakdown at 65nm node technology

F. Chen, Kaushik Chanda, Inderbir S. Gill et al. · 2005 · 42 citations

Materials Science, Tddb Degradation, Electrical Engineering +14

Low‐Temperature High‐Rate Capabilities of Lithium Batteries via Polarization‐Assisted Ion Pathways

Takashi Teranishi, Naoto Katsuji, Keisuke Chajima et al. · Advanced Electronic Materials · 2018 · 36 citations

Engineering, Planar Bto, Materials Science +16

Cooperative Redox Regulation of [4Fe-4S] Ferredoxin Model Arenethiolate Complexes by NH···S Hydrogen Bonds and an Aromatic C–H···S Interaction

Takafumi Ueno, M. Inohara, Norikazu Ueyama et al. · Bulletin of the Chemical Society of Japan · 1997 · 28 citations

Inorganic Chemistry, Nh···s Hydrogen Bonds, Benzoyl Group +14

Synthesis of nano-crystalline LiNbO3-decorated LiCoO2 and resulting high-rate capabilities

Takashi Teranishi, M. Inohara, Jun Kano et al. · Solid State Ionics · 2017 · 22 citations

Materials Science, Engineering, Lithium-ion Battery +2