Concepedia
Statistics
Publications
3
Citations
177
H-Index
Active since
2009
Haensch is an author specializing in engineering, microelectronics, and metal-oxide-semiconductor field-effect transistors.
Publications per year
2009–2011
Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm
Tega, Miki, Pagette et al. · Symposium on VLSI Technology · 2009 · 109 citations
Engineering, Computer Engineering, Electrical Engineering +16
Scaling of SOI FinFETs down to fin width of 4 nm for the 10nm technology node
Chang, Guillorn, Solomon Solomon et al. · Symposium on VLSI Technology · 2011 · 49 citations
Engineering, Computer Engineering, Electrical Engineering +14
Reliability of a 300-mm-compatible 3DI technology based on hybrid Cu-adhesive wafer bonding
Yu, Polastre, Chen et al. · Symposium on VLSI Technology · 2009 · 19 citations
Engineering, Materials Engineering, Materials Science +14
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