Bigang Min

Low-Frequency Noise in Submicrometer MOSFETs With HfO<tex>$_2$</tex>, HfO<tex>$_2/hbox Al_2hbox O_3$</tex>and HfAlO<tex>$_x$</tex>Gate Stacks

Bigang Min, Siva Prasad Devireddy, Zeynep Çelik‐Butler et al. · IEEE Transactions on Electron Devices · 2004 · 67 citations

Gate Stacks, Electrical Engineering, Engineering +14

Low-Frequency Noise in Submicrometer MOSFETs With HfO<tex>$_2$</tex>, HfO<tex>$_2/hbox Al_2hbox O_3$</tex>and HfAlO<tex>$_x$</tex>Gate Stacks

Bigang Min, Siva Prasad Devireddy, Zeynep Çelik‐Butler et al. · IEEE Transactions on Electron Devices · 2004 · 59 citations

Gate Stacks, Electrical Engineering, Engineering +14

Low-frequency noise characteristics of HfSiON gate-dielectric metal-oxide-semiconductor-field-effect transistors

Bigang Min, Siva Prasad Devireddy, Zeynep Çelik‐Butler et al. · Applied Physics Letters · 2005 · 33 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +13

Impact of interfacial layer on low-frequency noise of HfSiON dielectric MOSFETs

Bigang Min, Siva Prasad Devireddy, Zeynep Çelik‐Butler et al. · IEEE Transactions on Electron Devices · 2006 · 32 citations

Electrical Engineering, Semiconductor Device, Engineering +14

Low-frequency noise in TaSiN/HfO/sub 2/ nMOSFETs and the effect of stress-relieved preoxide interfacial layer

Siva Prasad Devireddy, Bigang Min, Zeynep Çelik‐Butler et al. · IEEE Transactions on Electron Devices · 2006 · 21 citations

Materials Science, Electrical Engineering, Tasin-gated N-channel Mosfets +12