Jeong‐Mo Hwang

Accurate extraction of reverse leakage current components of shallow silicided p/sup +/-n junction for quarter- and sub-quarter-micron MOSFET's

Hi‐Deok Lee, Jeong‐Mo Hwang · IEEE Transactions on Electron Devices · 1998 · 28 citations

Peripheral Leakage Components, Electrical Engineering, Engineering +15

Characterization of Corner-Induced Leakage Current of a Shallow Silicided n⁺/p Junction for Quarter-Micron MOSFETs

Hi-Deok Lee, Sang‐gi Lee, Seungho Lee et al. · Japanese Journal of Applied Physics · 1998 · 21 citations

Corner-induced Leakage Current, Semiconductor Technology, Electrical Engineering +11

Azide-assisted terminal crosslinking of ionomeric blocks: Effects on morphology and proton conductivity

Roshni Lilly Thankamony, Jeong‐Mo Hwang, Tae‐Hyun Kim · Journal of Membrane Science · 2011 · 17 citations

Proton Conductivity, Azide-assisted Terminal Crosslinking, Proton Transfer +5

Kinetics of Shallow Junction Activation: Physical Mechanisms

Harold Kennel, M.D. Giles, Milan Diebel et al. · 2006 · 15 citations

Biophysical Modeling, Engineering, Superactive Doping +18

A 15ns 4Mb NVSRAM in 0.13u SONOS Technology

Michael Fliesler, D.W. Still, Jeong‐Mo Hwang · 2008 · 11 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +12