Statistics
Publications
6
Citations
236
H-Index
6
Active since
2006
R. McKee is an author at Sandia National Laboratories specializing in electrical engineering, power electronics, and engineering.
Publications per year
2006–2010
6
6
SRAM Cell Static Noise Margin and VMIN Sensitivity to Transistor Degradation
A.T. Krishnan, V. Reddy, D. Aldrich et al. · 2006 · 44 citations
Engineering, Computer Engineering, Electrical Engineering +17
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